基于偶应力理论薄膜-基体界面剪应力尺寸效应的研究

STUDY ON SIZE EFFECT OF INTERFACIAL SHEAR STRESS BETWEEN FILM AND SUBSTRATE BASED ON COUPLE-STRESS THEORIES

  • 摘要:C1自然单元法应用于偶应力理论, 建立了偶应力理论无网格法。考虑到薄膜厚度在微米量级, 与其材料的特征长度相当, 因此基于构建的偶应力理论无网格法, 研究了薄膜-基体复合结构界面剪应力的尺寸效应现象。计算结果表明:随着薄膜厚度的减小, 无量纲界面剪应力(定义为偶应力理论下的剪应力与经典理论下的剪应力之比值)逐渐变小, 尺寸效应逐渐增强。对于给定的粘合强度, 偶应力理论下的剪应力要小于经典理论下的剪应力, 这意味着偶应力理论下薄膜更不容易发生脱胶失效现象。

     

    Abstract: C1 natural element method for couple-stress (CS) theories was constructed when C1 natural element method was applied to CS theories. Considering the fact that the thickness of film is on the micron scale, which is close to the material characteristic length scales, the size effect of interfacial shear stress between film and substrate was studied. Numerical results illustrated that with decrease in the film thickness, normalized interfacial shear stress (defined as the ratio of the shear stress in the CS theories to that in the classical theories) decreased gradually, while the size effect became stronger gradually. For a given bonding strength, the shear stress in the CS theories was less than that in the classical theories, which implied that it is hard to debond in the CS theories.

     

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