#x0201c;压电片-粘结层-主体结构#x0201d;动力耦合模型研究

杜国锋, 朱宏平, 胡均杰

杜国锋, 朱宏平, 胡均杰. #x0201c;压电片-粘结层-主体结构#x0201d;动力耦合模型研究[J]. 工程力学, 2013, 30(10): 148-153. DOI: 10.6052/j.issn.1000-4750.2012.06.0465
引用本文: 杜国锋, 朱宏平, 胡均杰. #x0201c;压电片-粘结层-主体结构#x0201d;动力耦合模型研究[J]. 工程力学, 2013, 30(10): 148-153. DOI: 10.6052/j.issn.1000-4750.2012.06.0465
DU Guo-feng, ZHU Hong-ping, HU Jun-jie. STUDY ON THE COUPLED MODEL OF #x0201c;PZT CHIP-ADHESIVE LAYER-MAIN STRUCTURE#x0201d;[J]. Engineering Mechanics, 2013, 30(10): 148-153. DOI: 10.6052/j.issn.1000-4750.2012.06.0465
Citation: DU Guo-feng, ZHU Hong-ping, HU Jun-jie. STUDY ON THE COUPLED MODEL OF #x0201c;PZT CHIP-ADHESIVE LAYER-MAIN STRUCTURE#x0201d;[J]. Engineering Mechanics, 2013, 30(10): 148-153. DOI: 10.6052/j.issn.1000-4750.2012.06.0465

#x0201c;压电片-粘结层-主体结构#x0201d;动力耦合模型研究

基金项目: 国家杰出青年科学基金项目(50925828)
详细信息
    作者简介:

    朱宏平(1965―),男,湖北人,教授,博士,院长,中国振动工程学会振动控制专业委员会理事,从事土木工程结构数值计算方法与应用、振动分析与控制、损伤检测与健康评估等方面的研究(E-mail: hpzhu@hust.edu.cn); 胡均杰(1984―),男,湖北人,硕士生,主要从事结构健康监测方面的研究(E-mail: hjnluck@126.com).

    通讯作者:

    杜国锋(1975―),男,吉林人,副教授,博士,副院长,湖北省土木建筑学会理事,从事组合结构和智能材料与结构方面的研究(E-mail:gfd_1125@126.com).

  • 中图分类号: TU318

STUDY ON THE COUPLED MODEL OF #x0201c;PZT CHIP-ADHESIVE LAYER-MAIN STRUCTURE#x0201d;

  • 摘要: 利用机电阻抗(EMI)识别结构损伤的技术已在航空航天、机械工程、土木工程等领域成功应用,与现阶段的应用相比,其理论研究和数值分析相对滞后。为获得PZT工作过程的数学模型,在研究现有的#x0201c;压电片-粘结层-主体结构#x0201d;耦合模型的基础上,提出了一种新的EMI耦合计算模型。通过建立模型成立的假设条件,对模型计算全过程进行了理论推导,获得了电导纳公式。此模型的建立丰富了压电阻抗技术的理论研究成果,为开展相关研究提供了参考。
    Abstract: The EMI technique, as a structural damage detection (SDD) technique, has been successfully applied in fields of aviation, mechanical engineering and civil engineering. However, compared with its application in recent years, the study on the theory and numeric is lagged behind. To avoid the theoretical lack in the application of EMI technique, in this paper, the author puts forward a new coupled model of #x0201c;PZT chip-adhesive layer-main structure (PAS)#x0201d;, which bases on recent several PAS models. By constructing the assumptions of the simplified model and deducing the overall procedure of theoretical calculation, we get the admittance formulation. This new EMI coupled model has a higher degree of accuracy and considers more factors including damping, which provides a reference for deeper theoretical study of EMI technique and a new clue for further study.
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出版历程
  • 收稿日期:  2012-06-14
  • 修回日期:  2012-10-20
  • 刊出日期:  2013-10-24

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